Test Date: 2018-06-08 13:08
Analysis date: 2018-08-28 11:15
PROCC2 ModuleFulltestROC_m5_1
Chips

Overview

_
Summary 1
Module Module PROCC2
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 27 - 1/0/0
DeadPixels Dead Pixels 0
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 0
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 27
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center RBI
TestDate Test Date 2018-06-08
TestTime Test Time 13:08
TestDuration Duration 0:11:35
TempC Temparature -5 °C
TBM1 TBM1 ok
TBM2 TBM2 ok
PxarVersion pXar v2.7.6+68 g4612851
DTB_FW DTB FW 4.7
ModuleIa Module Ia 24.1 mA
Summary 3
Noise Noise 112.68 e
NoiseROCs Noise grades 1/0/0
VcalThrWidth Vcal Thr. Width 76.00 e
VcalThrWidthROCs Vcal Thr. W. grades 1/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 1/0/0
PedestalSpread Pedestal Spread 2728.50 e
PedestalSpreadROCs Ped. Spread grades 1/0/0
Parameter1 Parameter1 0.56
Parameter1ROCs Par1 grades 1/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 0.49 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -5.0 °C 0.06 μA
CurrentVariation I(150 V) / I(100 V) 1.26
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -5.0 °C 0.06 μA
Variation I(150 V) / I(100 V) 1.26
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 0.49 μA
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 1.26
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
CalDel
mu μ 90.00
caldelspread CalDel spread 0
PHScale
mu μ 54.00
phscalespread PHScale spread 0
PHOffset
mu μ 166.00
phoffsetspread PHOffset spread 0
VthrComp
mu μ 113.00
vthrcompspread VthrComp spread 0
Vtrim
mu μ 224.00
vtrimspread Vtrim spread 0
Vana
mu μ 74.00
vanaspread Vana spread 0
Digital Current
Duration Duration 0:11:35
MinCurrent min. Current 0.032 A
MaxCurrent max. Current 0.038 A
Analog Current
Duration Duration 0:11:35
MinCurrent min. Current 0.003 A
MaxCurrent max. Current 0.042 A
ModuleIa Module Ia 24.1 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 21.70
Min min 21.70
Max max 21.70
NROCsNotProgrammable ROCs not programmable 0
Temperature
Temperature Temp. while test -5.02 +/- 0.03 °C
Duration Duration of test 0:11:32
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
27
0
0
27
0
0
0
0
0
0
0
112.68
1998
76
0.034
2728
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
Readback par0ia
Readback par1ia
Readback par2ia
GradingParameters
ModifiedGrading Modified Grading False
TBM
nTBMs n 0
TBMType Type unknown
Logfile

Overview

Errors
nCriticals # Criticals 0
nErrors # Errors 1
nWarnings # Warnings 1
channel_0_count Channel 0 1
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
v1.1.2-3-g1de6c7f on branch master